DocumentCode
2635887
Title
Logic Minimization and Testability of 2SPP-P-Circuits
Author
Bernasconi, Anna ; Ciriani, Valentina ; Trucco, Gabriella ; Villa, Tiziano
Author_Institution
Dept. of Comput. Sci., Univ. di Pisa, Pisa, Italy
fYear
2009
fDate
27-29 Aug. 2009
Firstpage
773
Lastpage
780
Abstract
We investigate a form of logic decomposition that generates a 2SPP-P-circuit, which includes two blocks representing the projected subfunctions obtained by Shannon cofactoring with respect to a chosen variable, and a block representing the intersection of the projections. The three blocks are implemented as minimal 2-SPP forms (XOR-ANDOR with XOR restricted to two inputs). The minimization is performed using as don´t care set the points in the intersection of the projections. This structure can be used in synthesis for low power or low delay, to move critical signals (e.g., with highest switching activity) toward the outputs with minimum area penalty. We prove an estimate by which the area of a 2SPP-P-circuit has at most twice the terms than its equivalent standard 2-SPP circuit (with no Shannon cofactoring). We also argue that the procedure delivers a circuit (when augmented with a pair of multiplexers) fully testable under the single stuck-at-fault model. We implemented the proposed synthesis procedure and we present encouraging results compared with standard 2-SPPs and SOPs.
Keywords
Boolean functions; circuit testing; information theory; logic gates; 2SPP-P-circuit; AND gate; Boolean function decomposition; OR gate; Shannon cofactoring; XOR gate; delay; logic decomposition; logic minimization; minimum area penalty; projected subfunctions; stuck-at-fault model; switching activity; testability; Boolean functions; Circuit synthesis; Circuit testing; Computer science; Delay; Energy consumption; Logic design; Logic testing; Minimization; Multiplexing; 2-SPP circuit; Boolean function decomposition; logic synthesis; multi-level synthesis;
fLanguage
English
Publisher
ieee
Conference_Titel
Digital System Design, Architectures, Methods and Tools, 2009. DSD '09. 12th Euromicro Conference on
Conference_Location
Patras
Print_ISBN
978-0-7695-3782-5
Type
conf
DOI
10.1109/DSD.2009.131
Filename
5350096
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