DocumentCode
2636380
Title
Defect tolerance scheme for gigaFLOP WSI architectures
Author
Singh, Adit D. ; Youn, Hee Yong
Author_Institution
Dept. of ECE, Massachusetts Univ., Amherst, MA, USA
fYear
1990
fDate
23-25 Jan 1990
Firstpage
109
Lastpage
115
Abstract
Performance is the one area in which a monolithic technology has potential unmatched by other approaches. Integrating an entire high performance system on a single piece of silicon eliminates the off-chip signal delays encountered in multichip implementations, which can become the performance bottleneck in highly pipelined array architectures. The major problem with achieving full wafer integration is that it is virtually impossible to realize such large area circuits entirely defect free. The authors present a scheme which can reconfigure the rectangular array using channel width of 2, while allowing short maximum restructured edge length. The yield of desired array in their design is much higher than that of other designs with same degree of redundancy
Keywords
MOS integrated circuits; VLSI; cellular arrays; fault tolerant computing; parallel architectures; pipeline processing; redundancy; channel width; entire high performance system; full wafer integration; gigaFLOP WSI architectures; highly pipelined array architectures; rectangular array; redundancy; short maximum restructured edge length; wafer scale integration WSI; yield; Clocks; Computer architecture; Computer science; Costs; Delay; Integrated circuit interconnections; Packaging; Pipeline processing; Silicon; Wafer scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Wafer Scale Integration, 1990. Proceedings., [2nd] International Conference on
Conference_Location
San Francisco, CA
Print_ISBN
0-8186-9013-5
Type
conf
DOI
10.1109/ICWSI.1990.63890
Filename
63890
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