• DocumentCode
    2636380
  • Title

    Defect tolerance scheme for gigaFLOP WSI architectures

  • Author

    Singh, Adit D. ; Youn, Hee Yong

  • Author_Institution
    Dept. of ECE, Massachusetts Univ., Amherst, MA, USA
  • fYear
    1990
  • fDate
    23-25 Jan 1990
  • Firstpage
    109
  • Lastpage
    115
  • Abstract
    Performance is the one area in which a monolithic technology has potential unmatched by other approaches. Integrating an entire high performance system on a single piece of silicon eliminates the off-chip signal delays encountered in multichip implementations, which can become the performance bottleneck in highly pipelined array architectures. The major problem with achieving full wafer integration is that it is virtually impossible to realize such large area circuits entirely defect free. The authors present a scheme which can reconfigure the rectangular array using channel width of 2, while allowing short maximum restructured edge length. The yield of desired array in their design is much higher than that of other designs with same degree of redundancy
  • Keywords
    MOS integrated circuits; VLSI; cellular arrays; fault tolerant computing; parallel architectures; pipeline processing; redundancy; channel width; entire high performance system; full wafer integration; gigaFLOP WSI architectures; highly pipelined array architectures; rectangular array; redundancy; short maximum restructured edge length; wafer scale integration WSI; yield; Clocks; Computer architecture; Computer science; Costs; Delay; Integrated circuit interconnections; Packaging; Pipeline processing; Silicon; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Scale Integration, 1990. Proceedings., [2nd] International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-8186-9013-5
  • Type

    conf

  • DOI
    10.1109/ICWSI.1990.63890
  • Filename
    63890