• DocumentCode
    2636778
  • Title

    Modeling and measurement of radiated emission through a cutout on the power/ground pl

  • Author

    Lee, Junwoo ; Kang, Jongho ; Park, Kunwoo ; Kim, Joungho

  • Author_Institution
    Hynix Semiconductor Inc.
  • Volume
    3
  • fYear
    2006
  • fDate
    14-18 Aug. 2006
  • Firstpage
    776
  • Lastpage
    780
  • Keywords
    Analytical models; Circuit noise; Circuit simulation; Eigenvalues and eigenfunctions; Integrated circuit interconnections; Magnetic noise; Power measurement; Printed circuits; Semiconductor device noise; Semiconductor device packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2006. EMC 2006. 2006 IEEE International Symposium on
  • Conference_Location
    Portland, OR, USA
  • Print_ISBN
    1-4244-0293-X
  • Type

    conf

  • DOI
    10.1109/ISEMC.2006.1706415
  • Filename
    1706415
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2636778