Investigations Of A Simple Emissivity Meter

We have developed a simple emissivity meter device with control electronic. The first part of the paper discusses the main laws of the thermal radiation, the structure of the measure chamber of the equipment. We present the two basic measurement methods, and the simple thermal resistance model of the system. The second part deals with the correlation between the half space average emissivity of surfaces and the emissivity measured by the equipment. For this characterisation we made detailed simulations using the FLOTHERM thermal flow simulator software and thermal transient measurements by the T3Ster equipment. The third part describes the method to reduce the settling time of the measurement. The paper is closed by the presentations of the results of the emissivity measurements of several surfaces