DocumentCode
2639715
Title
Topological conditions for fault diagnosability at subnetwork-level
Author
Huang, Dong-Quan ; Ye, Feng ; Yang, Zu-Ying
Author_Institution
Dept. of Electr. Eng., Fuzhou Univ., China
fYear
1990
fDate
1-3 May 1990
Firstpage
2240
Abstract
In fault analysis of analog circuits at subnetwork level, there are two essential problems: to determine whether all the torn nodes are accessible, and whether there are some topological conditions of the subnetwork which guarantee the fault at subnetwork-level to be diagnosed correctly. These problems are solved by the authors. The result is necessary and almost sufficient. If all torn nodes are to be accessible, the required topological conditions would be almost satisfied automatically. It is a special case of the authors´ research in the distribution of the accessible nodes
Keywords
analogue circuits; fault location; network analysis; network topology; accessible torn nodes; analog circuits; fault analysis; fault diagnosability; subnetwork-level; topological conditions; Analog circuits; Circuit analysis; Circuit faults; Equations; Fault detection; Fault diagnosis; Large-scale systems; Mutual coupling; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1990., IEEE International Symposium on
Conference_Location
New Orleans, LA
Type
conf
DOI
10.1109/ISCAS.1990.112334
Filename
112334
Link To Document