• DocumentCode
    2639715
  • Title

    Topological conditions for fault diagnosability at subnetwork-level

  • Author

    Huang, Dong-Quan ; Ye, Feng ; Yang, Zu-Ying

  • Author_Institution
    Dept. of Electr. Eng., Fuzhou Univ., China
  • fYear
    1990
  • fDate
    1-3 May 1990
  • Firstpage
    2240
  • Abstract
    In fault analysis of analog circuits at subnetwork level, there are two essential problems: to determine whether all the torn nodes are accessible, and whether there are some topological conditions of the subnetwork which guarantee the fault at subnetwork-level to be diagnosed correctly. These problems are solved by the authors. The result is necessary and almost sufficient. If all torn nodes are to be accessible, the required topological conditions would be almost satisfied automatically. It is a special case of the authors´ research in the distribution of the accessible nodes
  • Keywords
    analogue circuits; fault location; network analysis; network topology; accessible torn nodes; analog circuits; fault analysis; fault diagnosability; subnetwork-level; topological conditions; Analog circuits; Circuit analysis; Circuit faults; Equations; Fault detection; Fault diagnosis; Large-scale systems; Mutual coupling; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1990., IEEE International Symposium on
  • Conference_Location
    New Orleans, LA
  • Type

    conf

  • DOI
    10.1109/ISCAS.1990.112334
  • Filename
    112334