• DocumentCode
    2640359
  • Title

    Improving Utilization of Reconfigurable Resources Using Two Dimensional Compaction

  • Author

    El Farag, Ahmed A. ; El-Boghdadi, Hatem M. ; Shaheen, Samir I.

  • Author_Institution
    Comput. Eng. Dept., Cairo Univ., Giza
  • fYear
    2007
  • fDate
    16-20 April 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Partial reconfiguration allows parts of the reconfigurable chip area to be configured without affecting the rest of the chip. This allows placement of tasks at run time on the reconfigurable chip. Area management is a very important issue which highly affect the utilization of the chip and hence the performance. This paper focuses on a major aspect of moving running tasks to free space for new incoming tasks (compaction). We study the effect of compacting running tasks to free more contiguous space on the system performance. First, we introduce a straightforward compaction strategy called blind compaction. We use its performance as a reference to measure the performance of other compaction algorithms. Then we propose a two-dimensional compaction algorithm called one-corner compaction. This algorithm runs with respect to one chip corner. We further extend this algorithm to the four corners of the chip and introduce the 4-corner compaction algorithm. Finally, we compare the performance of these algorithms with some existing compaction strategies (Diessel, 2000). The simulation results show improvement in average task allocation time when using the 4-corner compaction algorithm by 15% and in chip utilization by 16% over the blind compaction. These results outperform the existing strategies
  • Keywords
    logic design; microprocessor chips; reconfigurable architectures; 2D compaction algorithm; blind compaction; four-corner compaction algorithm; one-corner compaction algorithm; reconfigurable resources; task allocation time; Compaction; Field programmable gate arrays; Resource management; Resumes; Scattering; Semiconductor device measurement; System performance; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
  • Conference_Location
    Nice
  • Print_ISBN
    978-3-9810801-2-4
  • Type

    conf

  • DOI
    10.1109/DATE.2007.364580
  • Filename
    4211785