DocumentCode
2640477
Title
Integrated technology enhanced automatic test equipment with adaptive fault detection
Author
Kirkland, Larry V. ; Ayala, Jesse ; Bolton, Steve ; Allred, Lloyd G. ; Dean, Jeffrey S.
fYear
1993
fDate
20-23 Sep 1993
Firstpage
267
Lastpage
272
Abstract
The authors have developed a machine-based intelligence system for automatic test equipment, which integrates various technologies in an adaptive fault-detection environment. Various technologies, other than normal ATE stimulus - reaction, including infrared, RF detection, etc. perceive non-visible information of current flow and circuit activity which can significantly enhance the technician´s perception of defective components
Keywords
Automatic test equipment; Circuit testing; Fault detection; Infrared detectors; Intelligent sensors; Machine intelligence; Ontologies; Radio frequency; Sensor systems; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '93. IEEE Systems Readiness Technology Conference. Proceedings
Conference_Location
San Antonio, TX
Print_ISBN
0-7803-0646-5
Type
conf
DOI
10.1109/AUTEST.1993.396344
Filename
396344
Link To Document