PASTEL: a parameterized memory characterization system

Author

Ogawa, Kimihiro ; Kohno, Michinari ; Kitamura, Fusako

Author_Institution

Design Autom. Dept., Sony Corp., Japan

fYear

1998

fDate

23-26 Feb 1998

Firstpage

15

Lastpage

20

Abstract

PASTEL is a parameterized memory characterization system which extracts the characteristics of ASIC on-chip-memories such as delay, timing and power consumption which are important in LSI logic design. PASTEL is a fully-automated process from exact wire-RC extraction through circuit reduction, input vector generation, waveform measurement, data-sheet and library creation. The circuit reduction scheme can reduce the circuit simulation time by 2 order of magnitude while maintaining delay error within 100 ps of exact simulation

Keywords

application specific integrated circuits; circuit CAD; circuit analysis computing; delays; integrated memory circuits; large scale integration; logic CAD; random-access storage; timing; waveform analysis; ASIC on-chip memories; LSI logic design; PASTEL; circuit reduction; circuit simulation; data-sheet creation; delay; input vector generation; library creation; parameterized memory characterization system; power consumption; timing; waveform measurement; wire-RC extraction; Character generation; Circuit simulation; Data mining;

fLanguage

English

Publisher

ieee

Conference_Titel

Design, Automation and Test in Europe, 1998., Proceedings

Conference_Location

Paris

Print_ISBN

0-8186-8359-7

Type

conf

DOI

10.1109/DATE.1998.655831

Filename

655831