Measurement corrections for phase noise characterization with different baseband analyzer

Author

Leng, Toh Chee

Author_Institution

Agilent Technol., Bayan Lepas Free Ind. Zone, Penang

fYear

2007

fDate

4-6 Dec. 2007

Firstpage

1

Lastpage

4

Abstract

Phase noise characterization with different instrument required different measurement corrections. In this paper, with frequency discriminator method, two types of spectrum analyzer, e.g. swept signal analyzer and Fast Fourier Transform (FFT) analyzer are used. By looking into the different of operation for the instrument, different sets of correction factor are determined. Considering the correction factor into the phase noise characterization, the measurement results are compared. With a signal source analyzer, the measurement corrections are further verified. A correction measurement with corrections for compensating the instrument effect in phase noise characterization is discussed.

Keywords

delay lines; fast Fourier transforms; oscillators; phase noise; spectral analysers; different baseband analyzer; fast Fourier transform; frequency discriminator; measurement corrections; phase noise characterization; spectrum analyzer; swept signal analyzer; Baseband; Delay lines; Frequency measurement; Instruments; Noise measurement; Oscillators; Phase measurement; Phase noise; Signal analysis; Spectral analysis; frequency discriminator; oscillator measurement; phase noise characterization; signal source analyzer; spectrum analyzer;

fLanguage

English

Publisher

ieee

Conference_Titel

Applied Electromagnetics, 2007. APACE 2007. Asia-Pacific Conference on

Conference_Location

Melaka

Print_ISBN

978-1-4244-1434-5

Electronic_ISBN

978-1-4244-1435-2

Type

conf

DOI

10.1109/APACE.2007.4603929

Filename

4603929