• DocumentCode
    2643953
  • Title

    Self Heating-Aware Optimal Wire Sizing under Elmore Delay Model

  • Author

    Ni, Min ; Memik, Seda Ogrenci

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Northwestern Univ., Evanston, IL
  • fYear
    2007
  • fDate
    16-20 April 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Global interconnect temperature keeps rising in the current and future technologies due to self-heating and the adiabatic property of top metal layers. The thermal effects impact adversely both reliability and performance of the interconnect wire, shortening the interconnect lifetime and increasing the interconnect delay. Such effects must be considered during the process of interconnect design. In this paper, one important argument is that the traditional linear dependence between wire resistance and wire width is no longer adequate for high layer interconnects due to the adiabatic property of these wires. By using curve fitting technique, we propose a quadratic model to represent the resistance of interconnect, which is aware of the thermal effects. Based on this model and the Elmore delay model, we derived a linear optimal wire sizing formula in form of f(x) = ax + b. Compared to non-thermal-aware exponential wire sizing formula inform of f(x) = ae -bx, we observed a 49.7% average delay gain with different choices of physical parameters
  • Keywords
    curve fitting; delays; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; Elmore delay model; adiabatic property; curve fitting; global interconnect temperature; interconnect delay; interconnect design; interconnect lifetime; interconnect resistance; linear optimal wire sizing; quadratic model; self-heating-aware optimal wire sizing; thermal effects; Conducting materials; Delay; Dielectric materials; Electrical capacitance tomography; Heat sinks; Performance analysis; Temperature; Thermal conductivity; Thermal resistance; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
  • Conference_Location
    Nice
  • Print_ISBN
    978-3-9810801-2-4
  • Type

    conf

  • DOI
    10.1109/DATE.2007.364489
  • Filename
    4211999