• DocumentCode
    2644123
  • Title

    Verification-Guided Soft Error Resilience

  • Author

    Seshia, Sanjit A. ; Li, Wenchao ; Mitra, Subhasish

  • Author_Institution
    California Univ., Berkeley, CA
  • fYear
    2007
  • fDate
    16-20 April 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Algorithmic techniques for formal verification can be used not just for bug-finding, but also to estimate vulnerability to reliability problems and to reduce overheads of circuit mechanisms for error resilience. We demonstrate this idea of verification-guided error resilience in the context of soft errors in latches. We show how model checking can be used to identify latches in a circuit that must be protected in order that the circuit satisfies a formal specification. Experimental results on a Verilog implementation of the ESA SpaceWire communication protocol indicate that the power overhead of soft error protection can be reduced by a factor of 4.35 by using our approach rather than protecting all latches
  • Keywords
    error detection; flip-flops; formal specification; formal verification; SpaceWire communication protocol; formal specification; formal verification; model checking; power overhead; verification-guided soft error resilience; Circuit faults; Error analysis; Fault diagnosis; Formal specifications; Hardware design languages; Latches; Power system protection; Power system reliability; Protocols; Resilience;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07
  • Conference_Location
    Nice
  • Print_ISBN
    978-3-9810801-2-4
  • Type

    conf

  • DOI
    10.1109/DATE.2007.364501
  • Filename
    4212011