DocumentCode
2644233
Title
A comparison of negative and positive selection algorithms in novel pattern detection
Author
Dasgupta, Dipankar ; Niño, Fernando
Author_Institution
Dept. of Math. Sci., Memphis Univ., TN, USA
Volume
1
fYear
2000
fDate
2000
Firstpage
125
Abstract
This paper describes a technique based on immunological principles for novel (anomalous) pattern detection. It is a probabilistic method that uses a negative selection scheme (complement pattern space) to detect any changes in the normal behavior of monitored data patterns. The technique is compared with a positive selection approach (implemented by an ART neural network), which uses the (self-) pattern space for anomaly detection. Some experimental results in both cases are reported
Keywords
ART neural nets; biocybernetics; pattern recognition; probability; ART neural network; anomalous pattern detection; anomaly detection; complement pattern space; immunology; monitored data pattern behavioural changes; negative selection algorithm; novel pattern detection; positive selection algorithm; probabilistic method; self-pattern space; Content based retrieval; Feature extraction; Helium; Immune system; Monitoring; Neural networks; Pathogens; Pattern matching; Pattern recognition; Subspace constraints;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man, and Cybernetics, 2000 IEEE International Conference on
Conference_Location
Nashville, TN
ISSN
1062-922X
Print_ISBN
0-7803-6583-6
Type
conf
DOI
10.1109/ICSMC.2000.884976
Filename
884976
Link To Document