• DocumentCode
    2645522
  • Title

    Application of feedforward and adaptive feedback control to semiconductor device manufacturing

  • Author

    Stoddard, K. ; Crouch, P. ; Kozicki, M. ; Tsakalis, K.

  • Author_Institution
    Center for Syst. Sci. & Eng., Arizona State Univ., Tempe, AZ, USA
  • Volume
    1
  • fYear
    1994
  • fDate
    29 June-1 July 1994
  • Firstpage
    892
  • Abstract
    A feedforward and adaptive feedback control methodology is developed and experimentally applied to several different processes commonly used in the fabrication of semiconductor integrated circuit devices. A circular parallel-plate capacitor with a glass (SiO2) dielectric is manufactured on silicon wafers to illustrate the use of these control strategies in the processes of silicon oxidation, aluminum metallization, lithography, and aluminum etching. The goal is to maintain a constant capacitance value on a run to run basis regardless of disturbances or modeling errors in the processes.
  • Keywords
    adaptive control; feedback; feedforward; semiconductor device manufacture; Al; Si; Si-SiO2-Al; adaptive feedback control; aluminum etching; aluminum metallization; circular parallel-plate capacitor; feedforward; glass dielectric; lithography; semiconductor device manufacturing; semiconductor integrated circuit devices; silicon oxidation; silicon wafers; Adaptive control; Aluminum; Capacitors; Fabrication; Feedback control; Glass; Programmable control; Semiconductor device manufacture; Semiconductor devices; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 1994
  • Print_ISBN
    0-7803-1783-1
  • Type

    conf

  • DOI
    10.1109/ACC.1994.751872
  • Filename
    751872