DocumentCode
2646767
Title
Basic rules and general method on similarity measures between vague sets
Author
Wang, Wei-ping ; Wu, Qi-zong ; Hu, Xiao-dong
Author_Institution
Beijing Inst. of Technol., Beijing
Volume
3
fYear
2007
fDate
2-4 Nov. 2007
Firstpage
1294
Lastpage
1299
Abstract
This paper firstly analyses some main similarity measures between vague sets and between elements at present and points out the same disadvantage of these measures. Then, some new basic rules are proposed to measure the rationality of similarity measures. According to the basic rules, a new method of similarity measures is introduced in general situations based on the concept of that the hesitancy/uncertain degree of elements should not be counteracted. Some of the necessary conditions of this similarity measure are also pointed out. Finally, the application of the similarity measure and its effectiveness are illustrated by an example in pattern recognition.
Keywords
fuzzy set theory; fuzzy sets; similarity measures; vague set theory; Conference management; Fuzzy sets; Mathematics; Notice of Violation; Pattern analysis; Pattern recognition; Set theory; Technology management; Variable structure systems; Wavelet analysis; Basic rules; General Method; Pattern recognition; Similarity measure; Vague sets;
fLanguage
English
Publisher
ieee
Conference_Titel
Wavelet Analysis and Pattern Recognition, 2007. ICWAPR '07. International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-1065-1
Electronic_ISBN
978-1-4244-1066-8
Type
conf
DOI
10.1109/ICWAPR.2007.4421634
Filename
4421634
Link To Document