DocumentCode
264716
Title
Dots and incipient based fingerprint matching scheme using FMM and delaunay triangulation
Author
Swain, Satyabrata ; Majhi, Banshidhar ; Dash, Ratnakar ; Sa, Pankaj Kumar
Author_Institution
Dept. of Comput. Sci. & Eng., Nat. Inst. of Technol., Rourkela, India
fYear
2014
fDate
15-17 Dec. 2014
Firstpage
1
Lastpage
6
Abstract
Automated Fingerprint Identification Systems (AFIS) currently rely only on Level 1 and Level 2 features. But these features are not much helpful for forensic experts as the experiment deals with partial to full print matching of latent fingerprint. Forensic experts takes the advantage of extended feature proposed by "Committee to Define an Extended Fingerprint Feature Set" (CDEFFS). This paper presents extraction technique of two extended features, dots and incipient ridges by tracing valleys. We have found starting points on the valley by analyzing the frequencies present in the fingerprint. Valley are traced from the starting point using first marching method (FMM). An intensity checking method is used for finding these feature points. Then matching are done by establishing spatial relation with minutiae using Delaunay triangulation. Extensive simulation is carried out in MATLAB environment to show the superiority of the proposed feature extraction technique over state of art. Accuracy of the proposed feature extraction scheme also has been shown using special database 30 and IIIT Delhi database.
Keywords
digital forensics; feature extraction; fingerprint identification; image matching; mesh generation; AFIS; CDEFFS; Delaunay triangulation; FMM; IIIT Delhi database; MATLAB environment; automated fingerprint identification systems; committee to define an extended fingerprint feature set; dots based fingerprint matching scheme; feature extraction scheme; forensic experts; full print matching; incipient based fingerprint matching scheme; intensity checking method; latent fingerprint; Databases; Entropy; Equations; Feature extraction; Fingerprint recognition; Forensics; Level set; Delaunay triangulation; Dots and incipient; Extended feature; Feature extraction; Fingerprint; Level 3 feature; Matching;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial and Information Systems (ICIIS), 2014 9th International Conference on
Conference_Location
Gwalior
Print_ISBN
978-1-4799-6499-4
Type
conf
DOI
10.1109/ICIINFS.2014.7036500
Filename
7036500
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