DocumentCode
2648638
Title
The Application of "Thru-Short-Delay" to the Calibration of the Dual Six-Port
Author
Engen, G.F. ; Hoer, C.A.
fYear
1978
fDate
27-29 June 1978
Firstpage
184
Lastpage
185
Abstract
In a companion paper, in this digest, a scheme for reducing the (single) six-port calibration problem to that of an equivalent four-port reflectometer has been described. This now makes it possible to apply existing four-port calibration schemes. One such method is the "thru-short-delay" (TSD) procedure. This paper briefly outlines this calibration approach.
Keywords
Added delay; Calibration; Linear systems; Measurement errors; Meter reading; NIST; Nonlinear equations; Protection; Scattering parameters; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1978 IEEE-MTT-S International
Conference_Location
Ottawa, ON, Canada
Type
conf
DOI
10.1109/MWSYM.1978.1123831
Filename
1123831
Link To Document