• DocumentCode
    2649179
  • Title

    Analysis of EUV radiaton from plasmas with low-Z elements and application to pulsed power experiments

  • Author

    Wilcox, Penka ; Safronova, Alla ; Kantsyrev, Victor ; Pokala, Shivaji ; Williamson, Kenneth ; Yilmaz, Fatih ; Struve, Kenneth ; McGurn, John

  • Author_Institution
    Dept. of Phys., Nevada Univ., Reno, NV
  • fYear
    2006
  • fDate
    4-8 June 2006
  • Firstpage
    283
  • Lastpage
    283
  • Abstract
    Summary form only given. The goal of this work is to develop theoretical support for advanced EUV diagnostics for magnetic insulation transmission line (MITL) study at SNL and for Z-pinch plasma study in general. EUV spectra of carbon and oxygen ions have been generated by a laser plasma source at the Z-pinch and laser-plasma X-ray/EUV facility at UNR. This source was designed for testing and calibration of the new X-ray/EUV devices. Polyethylene and mylar slabs attached to the computer-controlled 2D translation stage were used as targets. EUV spectra were collected by a spectrograph with a sliced multilayer grating which can cover a broad spectral region of 130-280 Aring. To increase sensitivity of the spectrograph and to add spatial resolution, glass capillary optics was employed. Non-LTE kinetic models developed for low-Z elements have been tested and used to identify the spectra and to provide plasma parameters. Application of these models and synthetic spectra to the existing and future MITL experiments on the 20 MA Z accelerator at SNL is discussed
  • Keywords
    Z pinch; plasma X-ray sources; plasma diagnostics; plasma kinetic theory; plasma light propagation; plasma sources; 130 to 280 angstrom; 20 MA; EUV diagnostics; EUV radiation; Z accelerator; Z-pinch plasma; glass capillary optics; kinetic models; laser plasma source; laser-plasma X-ray facility; magnetic insulation transmission line; mylar slabs; polyethylene; sliced multilayer grating; Chemical elements; Laser theory; Magnetic analysis; Plasma accelerators; Plasma applications; Plasma diagnostics; Plasma sources; Testing; Ultraviolet sources; X-ray lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. The 33rd IEEE International Conference on
  • Conference_Location
    Traverse City, MI
  • Print_ISBN
    1-4244-0125-9
  • Type

    conf

  • DOI
    10.1109/PLASMA.2006.1707156
  • Filename
    1707156