• DocumentCode
    2649851
  • Title

    Understanding Information Technology Preadoption and Postadoption: An Integrated Process Model

  • Author

    Qin Min ; Sheng-hua, XU

  • Author_Institution
    Jiangxi Univ. of Finance & Econ., Nanchang
  • fYear
    2007
  • fDate
    20-22 Aug. 2007
  • Firstpage
    239
  • Lastpage
    244
  • Abstract
    Much of the prior information technology (IT) research has done to explain users´ acceptance of initial IT. The first time adoption does not mean the IT continued use, so recent research has focused on IT postadoption behavior or continuance. The technology acceptance model (TAM) is recognized as an important theoretical model to interpret initial IT adoption behavior. Expectation confirmation theory (ECT) from the marketing literature is currently introduced to explain the IT postadoption behavior. However, IT adoption should be regarded as a process model rather than a static model at two separate time points. This paper examines and compares two models in explaining IT preadoption and postadoption stage, then suggests an integrated process model derived from them. The proposed process model was empirically tested in the context of Chinese students. The objective of the paper is to suggest future research directions for explaining IT adoption.
  • Keywords
    information technology; technology management; Chinese students; expectation confirmation theory; information technology postadoption; information technology preadoption; integrated process model; technology acceptance model; Conference management; Context modeling; Electrical capacitance tomography; Engineering management; Finance; Financial management; Information management; Information technology; Technological innovation; Technology management; expectation confirmation theory; information technology adoption; process model; technology acceptance model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Management Science and Engineering, 2007. ICMSE 2007. International Conference on
  • Conference_Location
    Harbin
  • Print_ISBN
    978-7-88358-080-5
  • Electronic_ISBN
    978-7-88358-080-5
  • Type

    conf

  • DOI
    10.1109/ICMSE.2007.4421854
  • Filename
    4421854