Automatic on-line memory tests in workstations

Author

Elm, Christian ; Klein, Michael ; Tavangarian, Djamshid

Author_Institution

Fern Univ., Hagen, Germany

fYear

1994

fDate

8-9 Aug 1994

Firstpage

98

Lastpage

103

Abstract

This paper presents a new approach called Stochastic Memory Allocation (SMA) to enhance the safety of workstations. It applies deterministic functional memory tests to the main memory of a workstation having parts of it selected stochastically in a sequential manner. The tests are carried our during normal work dynamically in parallel to other running processes. Important parameters are the amount of the selected part of the memory to be tested and the time between two tests considering the intensity the contents of the physical memory is changed by the memory management system. This new method may be used without changes concerning the kernel of the operating system or the hardware of the workstations

Keywords

automatic testing; computer testing; integrated circuit testing; integrated memory circuits; workstations; automatic online memory tests; deterministic functional memory tests; stochastic memory allocation; workstation main memory; Automatic testing; Content management; Kernel; Memory management; Operating systems; Safety; Sequential analysis; Stochastic processes; System testing; Workstations;

fLanguage

English

Publisher

ieee

Conference_Titel

Memory Technology, Design and Testing, 1994., Records of the IEEE International Workshop on

Conference_Location

San Jose, CA

Print_ISBN

0-8186-6245-X

Type

conf

DOI

10.1109/MTDT.1994.397190

Filename

397190