DocumentCode
2651192
Title
Measuring Anisotropy in Microwave Substrates
Author
Olyphant, M., Jr.
fYear
1979
fDate
April 30 1979-May 2 1979
Firstpage
91
Lastpage
93
Abstract
A split TE/sub 111/ cavity is described which enables the accurate measurement of the within-plane dielectric constant of a 1 inch disk cut from substrates in the range 25 to 125 mils in thickness. HP 67/97 programs are included for both end and center located specimens.
Keywords
Anisotropic magnetoresistance; Dielectric constant; Dielectric measurements; Dielectric substrates; Microwave measurements; Resonance; Resonant frequency; Tellurium; Testing; Thickness measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1979 IEEE MTT-S International
Conference_Location
Orlando, FL, USA
Type
conf
DOI
10.1109/MWSYM.1979.1123982
Filename
1123982
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