• DocumentCode
    2652108
  • Title

    Diagnostic and analytical study on diamond deposition in inductively coupled plasmas

  • Author

    Teii, Kungen ; Hori, Masaru

  • Author_Institution
    Dept. of Appl. Sci. for Electron. & Mater., Kyushu Univ., Fukuoka
  • fYear
    2006
  • fDate
    4-8 June 2006
  • Firstpage
    444
  • Lastpage
    444
  • Abstract
    Summary form only given. The majority of research on diamond chemical vapor deposition is conducted at moderate pressures of several tens of torr. In contrast, low pressures on the order of millitorr are highly desirable for controlling elementary processes at the surface due to long mean-free path of ions and radicals. In this study, the neutral radicals such as H and CH3 and positive ions responsible for diamond growth in a low-pressure inductively coupled plasma were detected by vacuum ultra-violet laser absorption spectroscopy and mass spectrometry as a function of pressure (10-80 mtorr). The growth rate and morphology of diamond were examined by applying a positive substrate and inserting a grid mesh to control the ion-bombardment energy. Theoretical growth rates were obtained from the measured H and CH3 densities by using contour lines of constant growth rates based on a simple growth model to examine the validity of the measured data. A threshold H density above which the growth is possible was determined to be in the range of 1011-1012 cm-3 by a kinetic rate analysis for desorption and incorporation of adsorbed CH 3 with an aid of H interactions
  • Keywords
    adsorption; desorption; diamond; free radical reactions; mass spectroscopy; plasma CVD; plasma chemistry; plasma density; plasma diagnostics; plasma transport processes; reaction kinetics; surface morphology; 10 to 80 mtorr; C; desorption; diamond chemical vapor deposition; grid mesh; inductively coupled plasmas; ion mean-free path; ion-bombardment energy; kinetic rate analysis; mass spectrometry; neutral radicals; vacuum ultraviolet laser absorption spectroscopy; Chemical elements; Chemical vapor deposition; Density measurement; Mass spectroscopy; Plasma chemistry; Plasma diagnostics; Plasma measurements; Pressure control; Process control; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2006. ICOPS 2006. IEEE Conference Record - Abstracts. The 33rd IEEE International Conference on
  • Conference_Location
    Traverse City, MI
  • Print_ISBN
    1-4244-0125-9
  • Type

    conf

  • DOI
    10.1109/PLASMA.2006.1707317
  • Filename
    1707317