DocumentCode
2653431
Title
Effect of refractive index of dielectric on transmission properties for metal/dielectric/metal photonic crystal
Author
Xiao, Gongli ; Huang, Yiping ; Bao, ZongMing
Author_Institution
Dept. of Microelectron., Fudan Univ., Shanghai, China
fYear
2009
fDate
20-23 Oct. 2009
Firstpage
1043
Lastpage
1046
Abstract
The effect of refractive index of dielectric on transmission properties for metal/dielectric/metal photonic crystal (M/D/MPhC) by changing a thin dielectric layer was studied experimentally. We measured zero-order transmission spectra of three different M/D/MPhC samples in the middle-infrared region and found that the transmission peaks shifted regularly along with the refractive index change, owing to the role of surface plasmon polaritons (SPP) coupling in the M/D/MPhC. The position of transmission peak for M/D/MPhC is not only determined by the periodic structure on top Au film but is also affected by the refractive index of intermediate dielectric. By analyzing the relationship between transmission peaks and effective refractive index of a thin dielectric layer sandwiched by two gold layers, we find that the transmission properties for M/D/MPhC depend strongly on both the material property and the refractive index of dielectric being sandwiched by two metal films. The transmission peak sensitive nature to the refractive index of a thin dielectric layer in M/D/MPhC is promising in applications of biochemical sensing and tunable integrated plasmonic devices.
Keywords
light transmission; photonic crystals; refractive index; biochemical sensing; metal/dielectric/metal photonic crystal; refractive index; surface plasmon polaritons; transmission properties; tunable integrated plasmonic devices; zero-order transmission spectra; Couplings; Dielectric measurements; Dielectric thin films; Gold; Material properties; Optical films; Periodic structures; Photonic crystals; Plasmons; Refractive index; M/D/MPhC; SPP; refractive index of dielectric; transmission enhancement;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 2009. ASICON '09. IEEE 8th International Conference on
Conference_Location
Changsha, Hunan
Print_ISBN
978-1-4244-3868-6
Electronic_ISBN
978-1-4244-3870-9
Type
conf
DOI
10.1109/ASICON.2009.5351510
Filename
5351510
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