DocumentCode
2656181
Title
Interchangeable boolean functions and their effects on redundancy in logic circuits
Author
Das, Debesh K. ; Chakrabort, Susanta ; Bhattacharya, Bhargab B.
Author_Institution
Dept. of Comput. Sci. & Eng., Jadavpur Univ., Calcutta, India
fYear
1998
fDate
10-13 Feb 1998
Firstpage
469
Lastpage
474
Abstract
A new concept of interchangeability of boolean functions under stuck-at faults in logic circuits is introduced in this paper. Two boolean functions F1 and F2 are said to be interchangeable if there exist two irredundant combinational networks N 1 and N2 realizing F1 and F2 respectively, such that under some single/multiple stuck-at fault f1(f2) in N1(N2), the faulty network realizes F2(F1). It has been shown that an infinite family of such interchangeable pairs of functions exist, and they play an important role in determining several new types of redundancy in combinational and sequential circuits
Keywords
Boolean functions; logic circuits; logic testing; combinational networks; faulty network; interchangeable boolean functions; logic circuits; redundancy; sequential circuits; stuck-at faults; Boolean functions; Circuit faults; Combinational circuits; Computer science; Electrical fault detection; Fault detection; Input variables; Logic circuits; Redundancy; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference 1998. Proceedings of the ASP-DAC '98. Asia and South Pacific
Conference_Location
Yokohama
Print_ISBN
0-7803-4425-1
Type
conf
DOI
10.1109/ASPDAC.1998.669527
Filename
669527
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