• DocumentCode
    2656181
  • Title

    Interchangeable boolean functions and their effects on redundancy in logic circuits

  • Author

    Das, Debesh K. ; Chakrabort, Susanta ; Bhattacharya, Bhargab B.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Jadavpur Univ., Calcutta, India
  • fYear
    1998
  • fDate
    10-13 Feb 1998
  • Firstpage
    469
  • Lastpage
    474
  • Abstract
    A new concept of interchangeability of boolean functions under stuck-at faults in logic circuits is introduced in this paper. Two boolean functions F1 and F2 are said to be interchangeable if there exist two irredundant combinational networks N 1 and N2 realizing F1 and F2 respectively, such that under some single/multiple stuck-at fault f1(f2) in N1(N2), the faulty network realizes F2(F1). It has been shown that an infinite family of such interchangeable pairs of functions exist, and they play an important role in determining several new types of redundancy in combinational and sequential circuits
  • Keywords
    Boolean functions; logic circuits; logic testing; combinational networks; faulty network; interchangeable boolean functions; logic circuits; redundancy; sequential circuits; stuck-at faults; Boolean functions; Circuit faults; Combinational circuits; Computer science; Electrical fault detection; Fault detection; Input variables; Logic circuits; Redundancy; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference 1998. Proceedings of the ASP-DAC '98. Asia and South Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    0-7803-4425-1
  • Type

    conf

  • DOI
    10.1109/ASPDAC.1998.669527
  • Filename
    669527