An S-parameter extraction technique for broad-band characterization of microstrip-to-SIW transitions

Author

Georgakopoulos, Stavros ; Ogurtsov, Stanislav

Author_Institution

Dept. of Electr. & Comput. Eng., Florida Int. Univ., Miami, FL, USA

fYear

2009

fDate

1-5 June 2009

Firstpage

1

Lastpage

4

Abstract

An S-parameter extraction technique for broad-band characterization of transitions (discontinuities) at microwaves is presented. The technique is developed for extraction of S-parameters when a single transition between two transmission lines cannot be: (a) rigorously defined in a full-wave solver, and consequently directly simulated, and/or (b) directly measured. The presented technique includes a procedure to obtain S-parameters at the break down frequency points thereby providing data for a broad bandwidth. The accuracy of the technique is validated on test examples.

Keywords

S-parameters; microstrip transitions; substrate integrated waveguides; transmission lines; S-parameter extraction technique; break down frequency points; broad bandwidth; broadband characterization; full-wave solver; microstrip-to-SIW transitions; transmission lines; Connectors; Equations; Frequency; Instruments; Microstrip; Microwave devices; Microwave theory and techniques; Propagation constant; Scattering parameters; Waveguide transitions;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium, 2009. APSURSI '09. IEEE

Conference_Location

Charleston, SC

ISSN

1522-3965

Print_ISBN

978-1-4244-3647-7

Type

conf

DOI

10.1109/APS.2009.5172241

Filename

5172241