• DocumentCode
    2657296
  • Title

    Contributing to the bottom line: optimizing reliability cost schedule tradeoff and architecture scalability through test technology

  • Author

    Boyd, D. ; Cura, D. ; Ehreich, W. ; Gotberg, R. ; Hariharan, R. ; Reeser, P.

  • Author_Institution
    AT&T Labs., USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    136
  • Lastpage
    147
  • Abstract
    A challenging problem in software testing is finding the optimal point at which costs justify the stop-test decision. We first present an economic model that can be used to evaluate the consequences of various stop-test decisions. We then discuss two approaches for assessing performance, automated load test generation in the context of empirical testing and performance modeling, and illustrate how these techniques can affect the stop-test decision. We then illustrate the application of these two techniques to evaluating the performance of Web servers that performs significant server-side processing through object-oriented (OO) computing. Implications of our work for Web server performance evaluation in general are discussed
  • Keywords
    Internet; distributed object management; file servers; program testing; software architecture; software cost estimation; software performance evaluation; software reliability; Web servers; architecture scalability; automated load test generation; economic model; object-oriented computing; performance modeling; reliability cost schedule tradeoff; server-side processing; software testing; stop-test decision; Application software; Automatic testing; Context modeling; Cost function; Fault detection; Object oriented modeling; Scalability; Software testing; System testing; Web server;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Software Reliability Engineering, 2000. ISSRE 2000. Proceedings. 11th International Symposium on
  • Conference_Location
    San Jose, CA
  • ISSN
    1071-9458
  • Print_ISBN
    0-7695-0807-3
  • Type

    conf

  • DOI
    10.1109/ISSRE.2000.885867
  • Filename
    885867