DocumentCode
2658604
Title
Noise figure vs. PM noise measurements: a study at microwave frequencies
Author
Hati, A. ; Howe, D.A. ; Walls, F.L. ; Walker, D.
Author_Institution
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear
2003
fDate
4-8 May 2003
Firstpage
516
Lastpage
520
Abstract
This paper addresses two issues: (i) it compares the usefulness of phase-modulation (PM) noise measurements vs. noise figure (NF) measurements in characterizing the merit of an amplifier, and (ii) it reconciles a general misunderstanding in using -174 dBc/Hz (relative to carrier input power of 0 dBm) as thermal noise level. The residual broadband (white PM) noise is used as the basis for estimating the noise figure (NF) of an amplifier. We have observed experimentally that many amplifiers show an increase in the broadband noise of 1 to 5 dB as the signal level through the amplifier increases. This effect is linked to input power through the amplifier´s nonlinear intermodulation distortion. Consequently, this effect is reduced as linearity is increased. It is important to note that NF is sometimes used as a selection criteria for an amplifier but yields no information about potentially important close-to-carrier 1/f noise of an amplifier, whereas PM and amplitude modulation (AM) noise measurements do. We have verified theoretically and experimentally that the single-sideband PM (and AM) noise floor due to thermal noise is -177 dBc/Hz, relative to a carrier input power of 0 dBm.
Keywords
III-V semiconductors; amplitude modulation; gallium arsenide; intermodulation distortion; microwave amplifiers; noise measurement; phase modulation; phase noise; semiconductor device models; semiconductor device noise; thermal noise; wideband amplifiers; 1 to 5 dB; GaAs; amplifier nonlinear intermodulation distortion; amplitude modulation; microwave frequencies; noise figure-PM noise measurements; phase modulation; residual broadband noise; single sideband PM noise floor; thermal noise level; Broadband amplifiers; Intermodulation distortion; Linearity; Microwave frequencies; Noise figure; Noise level; Noise measurement; Power amplifiers; Power measurement; White noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International
ISSN
1075-6787
Print_ISBN
0-7803-7688-9
Type
conf
DOI
10.1109/FREQ.2003.1275144
Filename
1275144
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