• DocumentCode
    2658618
  • Title

    40 V high voltage arbitrary waveform pulse generator at automatic parametric tester

  • Author

    Pan, Yang ; Yu, James ; Kim, Jay ; Griffiths, Peter

  • Author_Institution
    Keithley Instrum., Cleveland
  • fYear
    2007
  • fDate
    12-14 Dec. 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    This paper introduces the development work of high voltage pulse capability of Keithley automatic parametric tester (APT). To meet the market demand for high voltage (40 V) function/arbitrary waveform pulse generator, Keithley Instruments developed new pulse generator that implements both features of high voltage and function/arbitrary pulse waveform within single instrument. Integrated this new pulse generator into APT, provides flash memory manufacturer a powerful tool to measure flash memory device in both Fab and Lab environment more easily and quickly than ever before. Flash memories are penetrating a wide variety of markets and products. Application examples are memory cards, MP3 audio players, cell phones, and digital cameras. This development work is driven by the demand of flash memory tests, more specifically, multilevel-flash-memories tests.
  • Keywords
    automatic testing; flash memories; pulse generators; waveform generators; APT; Fab environment; Keithley automatic parametric tester; Lab environment; high voltage arbitrary waveform pulse generator; multilevel-flash-memories tests; voltage 40 V; Automatic testing; Cellular phones; Digital audio players; Digital cameras; Flash memory; Instruments; Manufacturing; Pulse generation; Pulse measurements; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Device Research Symposium, 2007 International
  • Conference_Location
    College Park, MD
  • Print_ISBN
    978-1-4244-1892-3
  • Electronic_ISBN
    978-1-4244-1892-3
  • Type

    conf

  • DOI
    10.1109/ISDRS.2007.4422356
  • Filename
    4422356