DocumentCode
2658629
Title
Simulation of breakdown in small confined volumes inside dielectrics for electrical ageing and diagnostics
Author
Pashinin, Igor ; Pancheshnyi, Sergey ; Le Roy, Séverine ; Pitchford, Leanne C.
Author_Institution
INP; LAPLACE (Lab. Plasma et Conversion d´´Energie), Univ. de Toulouse; UPS, Narbonne, France
fYear
2010
fDate
17-20 Oct. 2010
Firstpage
1
Lastpage
4
Abstract
The objective of the present work is to develop a self-consistent model of DC and AC discharges in small voids in insulating materials encompassing an improved description of processes linked to the dielectric itself. To this end, a one-dimensional fluid model based on transport equations for charge carriers coupled to Poisson´s equation for electric fields was constructed for dielectrics containing air-filled voids of various sizes. Electron emission from the dielectric surface at the dielectric-gas interface is either continuous or discrete and is supposed to depend on the electric field at the surface. For DC voltages we find that current pulses exist for a range of conditions. These are due to the rapid accumulation of positive charges at the interface in partial discharge events and their eventual neutralization by electrons injected from the cathode and moving in the bulk dielectric. In AC, the transport of charges inside the dielectric has little influence on the discharge dynamics in gas, and the emission properties at the interface determine the shape and repetition rate of the current pulses.
Keywords
Poisson equation; dielectric materials; electric breakdown; electron emission; partial discharges; voids (solid); AC discharge; DC discharge; DC voltage; Poisson equation; air-filled void; breakdown simulation; current pulse; dielectric-gas interface; electric field; electrical ageing; electron emission; one-dimensional fluid model; partial discharge; small confined volume; transport equation; Dielectrics; Discharges; Electron traps; Mobile communication; Partial discharges; Spontaneous emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena (CEIDP), 2010 Annual Report Conference on
Conference_Location
West Lafayette, IN
ISSN
0084-9162
Print_ISBN
978-1-4244-9468-2
Type
conf
DOI
10.1109/CEIDP.2010.5723971
Filename
5723971
Link To Document