• DocumentCode
    2659451
  • Title

    Characteristics of the unique modes in HBARs

  • Author

    Pao, Shih-Yung ; Wang, Zuoqing ; Huang, Zi-Neng ; Chao, Min-Chiang ; Lam, C.S. ; Chang, Pei-Zen

  • Author_Institution
    Inst. of Appl. Mech., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2003
  • fDate
    4-8 May 2003
  • Firstpage
    785
  • Lastpage
    793
  • Abstract
    Simulation results for three kinds of HBARs with different piezo-film and substrate combinations are presented. Based on the distributions of the resonance frequency spacing and the effective coupling factor keff2(m) , which significantly rely on the acoustic impedance ratio of the piezo-film to substrate, a unique mode with maximum keff2(m) can be chosen. For the unique mode of the HBARs, the variations of the Q-value of the series resonance frequency, Qs, the effective coupling factor keff2(m), the motional resistance R1, the capacitance ratio r=C0/C1, the F.O.M.=QsC1/2C0, and Qs·keff2(m), with the thickness of the substrate are calculated. Those data give some guidelines to choose the thickness of the substrate for compromising the parameters of the operating mode. Results showed that it is unnecessary to choose very thick substrate for obtaining high Q. Actually, high Q can be obtained when the thickness ratio to the film reaches about 50 to 150 for the three different kinds of samples.
  • Keywords
    Q-factor; acoustic impedance; acoustic resonators; bulk acoustic wave devices; capacitance; piezoelectric thin films; piezoresistance; Q-value; acoustic impedance ratio; bulk acoustic wave resonators; capacitance ratio; effective coupling factor; motional resistance; piezofilm; resonance frequency spacing; Capacitance; Chaos; Cities and towns; Frequency control; Guidelines; Impedance; Oscillators; Resonance; Resonant frequency; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium and PDA Exhibition Jointly with the 17th European Frequency and Time Forum, 2003. Proceedings of the 2003 IEEE International
  • ISSN
    1075-6787
  • Print_ISBN
    0-7803-7688-9
  • Type

    conf

  • DOI
    10.1109/FREQ.2003.1275192
  • Filename
    1275192