DocumentCode
2660810
Title
A 6b 3GS/s 11mW fully dynamic flash ADC in 40nm CMOS with reduced number of comparators
Author
Shu, Yun-Shiang
Author_Institution
MediaTek Inc., Hsinchu, Taiwan
fYear
2012
fDate
13-15 June 2012
Firstpage
26
Lastpage
27
Abstract
A 6b 3GS/s fully dynamic flash ADC is fabricated in 40nm CMOS and occupies 0.021mm2. Dynamic comparators with digitally controlled built-in offset are realized with imbalanced tails. Half of the comparators are substituted with simple SR latches. The ADC achieves SNDRs of 36.2dB and 33.1dB at DC and Nyquist, respectively, while consuming 11mW from a 1.1V supply.
Keywords
CMOS integrated circuits; analogue-digital conversion; comparators (circuits); flip-flops; CMOS; SR latch; comparator; digitally controlled built-in offset; dynamic comparator; fully dynamic flash ADC; noise figure 36.2 dB to 33.1 dB; power 11 mW; size 40 nm; voltage 1.1 V; CMOS integrated circuits; Capacitors; Latches; Noise; Resistors; Strontium; Transistors; comparator offset calibration; dynamic ADC; flash ADC; interpolation;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits (VLSIC), 2012 Symposium on
Conference_Location
Honolulu, HI
Print_ISBN
978-1-4673-0848-9
Electronic_ISBN
978-1-4673-0845-8
Type
conf
DOI
10.1109/VLSIC.2012.6243772
Filename
6243772
Link To Document