DocumentCode
2660836
Title
Advanced power cycling test for power module with on-line on-state VCE measurement
Author
Ui-Min Choi ; Trintis, Ionut ; Blaabjerg, Frede ; Jorgensen, Soren ; Svarre, Morten Liengaard
Author_Institution
Dept. of Energy Technol., Aalborg Univ., Aalborg, Denmark
fYear
2015
fDate
15-19 March 2015
Firstpage
2919
Lastpage
2924
Abstract
Recent research has made an effort to improve the reliability of power electronic systems to comply with more stringent constraints on cost, safety, predicted lifetime and availability in many applications. For this, studies about failure mechanisms of power electronic components and lifetime estimation of power semiconductor devices and capacitors have been done. Accelerated power cycling test is one of the common tests to assess the power device module and develop the lifetime model considering the physics of failure. In this paper, a new advanced power cycling test setup is proposed for power module. The proposed concept can perform various stress conditions which is valid in a real mission profile and it is using a real power converter application with small loss. The concept of the proposed test setup is first presented. Then, the on-line on-state collector-emitter voltage VCE measurement for condition monitoring of the test device is discussed. Finally, a characterization method of test device regarding on-state VCE for junction temperature estimation is proposed. The experimental results of the prototype confirm the validity and the effectiveness of proposed test setup.
Keywords
condition monitoring; failure analysis; life testing; power convertors; advanced power cycling test; capacitors; condition monitoring; failure mechanisms; junction temperature estimation; lifetime estimation; on-line on-state collector-emitter voltage VCE measurement; power converter; power device module; power electronic system reliability; power semiconductor devices; stress conditions; test device characterization method; Current measurement; Heat sinks; Insulated gate bipolar transistors; Junctions; Temperature measurement; Transistors; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Power Electronics Conference and Exposition (APEC), 2015 IEEE
Conference_Location
Charlotte, NC
Type
conf
DOI
10.1109/APEC.2015.7104765
Filename
7104765
Link To Document