• DocumentCode
    2663912
  • Title

    Reconfigurable low-power Concurrent Error Detection in logic circuits

  • Author

    Almukhaizim, Sobeeh ; Bunian, Sara ; Sinanoglu, Ozgur

  • Author_Institution
    Comput. Eng. Dept., Kuwait Univ., Safat, Kuwait
  • fYear
    2010
  • fDate
    14-15 Dec. 2010
  • Firstpage
    91
  • Lastpage
    96
  • Abstract
    Concurrent Error Detection (CED) methods are commonly employed to provide some level of error detection capability at the cost of some area and power overhead. In many applications, however, the error detection capability must be reconfigured dynamically, in order to adapt to the available power budget, criticality of the processed data, a thermal-safe schedule, etc. In this work, we propose a reconfigurable duplication-based CED infrastructure for logic circuits. The key idea is to enable/disable the operation of the duplicate circuit according to a set of control conditions. When CED is disabled, the inputs to the duplicate circuit retain their previous values (i.e., reduction in power dissipation via elimination of switching activity), yet errors are not detected (i.e., reduction in CED coverage). Experimental results using judicious and random selection of control conditions yield the same end-result; power dissipation is commensurate with CED coverage. Therefore, LFSR structures can be used to easily generate and reconfigure conditions, enabling their dynamic adjustment to adapt to the power constraints of the system.
  • Keywords
    error detection; logic circuits; low-power electronics; CED method; LFSR structure; logic circuit; power dissipation; power overhead; reconfigurable low-power concurrent error detection method; thermal-safe schedule; Circuit faults; Drives; Logic gates; Multiplexing; Power dissipation; Registers; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test Workshop (IDT), 2010 5th International
  • Conference_Location
    Abu Dhabi
  • Print_ISBN
    978-1-61284-291-2
  • Electronic_ISBN
    978-1-61284-290-5
  • Type

    conf

  • DOI
    10.1109/IDT.2010.5724415
  • Filename
    5724415