• DocumentCode
    2663999
  • Title

    Session 3.1: Test generation, BIST, and memory testing

  • fYear
    2010
  • fDate
    14-15 Dec. 2010
  • Firstpage
    115
  • Lastpage
    116
  • Abstract
    Start of the above-titled section of the conference proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test Workshop (IDT), 2010 5th International
  • Conference_Location
    Abu Dhabi
  • Print_ISBN
    978-1-61284-291-2
  • Electronic_ISBN
    978-1-61284-290-5
  • Type

    conf

  • DOI
    10.1109/IDT.2010.5724420
  • Filename
    5724420
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2663999