• DocumentCode
    2665654
  • Title

    Lateral Field Excitation of membrane-based Aluminum Nitride resonators

  • Author

    Gorisse, M. ; Reinhardt, A. ; Billard, C. ; Borel, M. ; Defaÿ, E. ; Bertaud, T. ; Lacrevaz, T. ; Bermond, C.

  • Author_Institution
    Leti, CEA, Grenoble, France
  • fYear
    2011
  • fDate
    2-5 May 2011
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper reports the fabrication of Lateral Field Excitation resonators on a free-standing Aluminum Nitride membrane. We present a very simple fabrication process, and discuss the electrical measurements. In particular, the influence of the electrode width on the generation of parasitic longitudinal waves is demonstrated. We also provide measurements of the temperature dependence of the resonance frequency of the thickness-shear mode, which is of -14 ppm/°C, being much lower than the temperature dependence of the thickness-extensional mode in the same material stack.
  • Keywords
    III-V semiconductors; aluminium compounds; bulk acoustic wave devices; membranes; resonators; temperature measurement; wide band gap semiconductors; AlN; electrical measurements; electrode; fabrication process; lateral field excitation resonators; membrane-based aluminum nitride resonators; temperature dependence measurements; thickness-extensional mode; thickness-shear mode; Acoustics; Electric fields; Electrodes; Films; Frequency measurement; Resonant frequency; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control and the European Frequency and Time Forum (FCS), 2011 Joint Conference of the IEEE International
  • Conference_Location
    San Fransisco, CA
  • ISSN
    1075-6787
  • Print_ISBN
    978-1-61284-111-3
  • Type

    conf

  • DOI
    10.1109/FCS.2011.5977794
  • Filename
    5977794