• DocumentCode
    2666210
  • Title

    Wire bonding: Present and future trends

  • Author

    Chen, A.S. ; Nguyen, L.T. ; Burke, T.S. ; Belani, J.G.

  • Author_Institution
    Nat. Semicond. Corp., Santa Clara, CA, USA
  • fYear
    1993
  • fDate
    4-6 Oct 1993
  • Firstpage
    45
  • Lastpage
    51
  • Abstract
    Gold wire thermosonic bonding remains the primary means of electrically connecting the silicon chip to the outside world. To keep up with the increasing interconnect density required by the ever shrinking die and with the need for package compactness, both wire and wire bonder manufacturers have made many improvements in technology. If the miniaturization trend continues at the current rate, the physical and process limits will ultimately be reached. The other possible technologies such as gold wedge bonding, tape automated bonding (TAB), and flip-chip offer some potential attractive interconnection solutions. These techniques also have their own inherent disadvantages. Until such drawbacks are resolved, the capabilities of thermosonic bonding will continue to be pushed as far as possible
  • Keywords
    flip-chip devices; lead bonding; packaging; reviews; tape automated bonding; technological forecasting; Au; coated wires; equipment improvements; flip-chip; miniaturization trend; process limits; tape automated bonding; thermosonic bonding; wedge bonding; wire bonding; wire materials; Bonding; Gold; Intermetallic; Lattices; Manufacturing; Motion control; Packaging machines; Plastic packaging; Semiconductor device packaging; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1993, Fifteenth IEEE/CHMT International
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    0-7803-1424-7
  • Type

    conf

  • DOI
    10.1109/IEMT.1993.398223
  • Filename
    398223