• DocumentCode
    2666226
  • Title

    VMOS, UMOS technology simulation

  • Author

    Kersys, T. ; Andriukaitis, D. ; Anilionis, R.

  • Author_Institution
    Dept. of Electron. Eng., Kaunas Univ. of Technol.
  • fYear
    0
  • fDate
    0-0 0
  • Firstpage
    537
  • Lastpage
    542
  • Abstract
    VMOS, UMOS ("V"-groove-metal-oxide-silicon) transistors drain and gate are formed in the groove of "V" or "U" form. Expanding channel area, therefore VMOS and UMOS structures may use in the power chips. Using VMOS, UMOS is saving 40% free space than using NMOS technology. Nanostructures dimensions are very small, so it is important to keep pn junction in a right depth, in the all semiconductor manufacturing technological process. Analyzing influence to forming structure of each technological operation is used mathematical simulation program SUPREM IV. VMOS and UMOS technological operation was simulated in micro and nano level
  • Keywords
    MOSFET; nanotechnology; semiconductor device manufacture; semiconductor process modelling; U-groove-metal-oxide-silicon; V-groove-metal-oxide-silicon; mathematical simulation program; nanostructure dimension; nanotechnology; pn junction; power chip; semiconductor manufacturing technological process; transistor; Analytical models; Boron; Doping; Ion implantation; Manufacturing processes; Semiconductor process modeling; Silicon; Space technology; Substrates; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Technology Interfaces, 2006. 28th International Conference on
  • Conference_Location
    Cavtat/Dubrovnik
  • ISSN
    1330-1012
  • Print_ISBN
    953-7138-05-4
  • Type

    conf

  • DOI
    10.1109/ITI.2006.1708538
  • Filename
    1708538