DocumentCode
2669444
Title
Second-harmonic generation and reflectance-difference: a meeting of two surface spectroscopies
Author
Kwon, J. ; Downer, M.C.
Author_Institution
Texas Mater. Inst., Texas Univ., Austin, TX, USA
fYear
2003
fDate
6-6 June 2003
Abstract
Second-harmonic (SH) and reflectance-difference (RD) spectra of vicinal oxidized Si(001) surfaces near the E/sub 1/ resonance reveal similar structure in their lowest-order anisotropic Fourier component, suggesting a common origin in the step-edges.
Keywords
elemental semiconductors; optical harmonic generation; reflectivity; silicon; ultraviolet spectra; Si; anisotropic Fourier component; oxidized Si(001) surfaces; reflectance-difference; second-harmonic generation; surface spectroscopies; Anisotropic magnetoresistance; Geometrical optics; Nonlinear optical devices; Nonlinear optics; Optical devices; Optical harmonic generation; Optical materials; Pulse measurements; Spectroscopy; Surface emitting lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science, 2003. QELS. Postconference Digest
Conference_Location
Baltimore, MD, USA
Print_ISBN
1-55752-749-0
Type
conf
DOI
10.1109/QELS.2003.238322
Filename
1276245
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