DocumentCode
2670297
Title
Advanced process & product reliability development in fabless environment
Author
Verma, Gautam ; Wu, Kenneth ; Euzent, Bruce ; Huang, Cheng
Author_Institution
Altera Corp., San Jose, CA, USA
fYear
2009
fDate
26-30 April 2009
Firstpage
236
Lastpage
243
Abstract
In this paper, we discuss the methodology used between a foundry and a fabless FPGA component supplier for ensuring a high yielding, reliable FPGA product at an advanced technology node. It is shown that close collaboration between the fabless supplier and foundry in technology development and manufacturing is essential for success. We discuss historical reliability trends as well as reliability data from the latest 40 nm technology, which today is the most advanced technology node for a FPGA in production.
Keywords
field programmable gate arrays; foundries; integrated circuit reliability; integrated circuit yield; product development; advanced process development; fabless FPGA component supplier; foundry; product reliability development; reliable FPGA product yield; size 40 nm; Circuit synthesis; Collaboration; Failure analysis; Field programmable gate arrays; Foundries; Integrated circuit reliability; Manufacturing; Packaging; Production; Qualifications;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 2009 IEEE International
Conference_Location
Montreal, QC
ISSN
1541-7026
Print_ISBN
978-1-4244-2888-5
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2009.5173256
Filename
5173256
Link To Document