• DocumentCode
    2671239
  • Title

    Wavelet neural networks based fault diagnosis of analog circuit

  • Author

    Xiaoqin, Liu ; Dazhi, Wang

  • Author_Institution
    Coll. of Inf. Sci. & Eng., Northeastern Univ., Shenyang, China
  • fYear
    2012
  • fDate
    23-25 May 2012
  • Firstpage
    2234
  • Lastpage
    2239
  • Abstract
    The fault diagnosis of analog circuits has made many ways, such as the fault dictionary method, device parameter identification method and so on. However, due to the diversity of fault types, component tolerances, nonlinear, and the measured response signal usually contains non-stationary and time-varying signal component in the analog circuit failure, the fault diagnosis becomes difficult. Fault diagnosis method based on wavelet neural network can solve these problems. Multisim software is used to establish analog circuits, wavelet neural network is trained by additional momentum term and adaptive learning rate BP algorithm, the characteristics of analog circuit fault is classified and identified, simulation results demonstrate the effectiveness of the method.
  • Keywords
    analogue circuits; failure analysis; fault diagnosis; learning (artificial intelligence); neural nets; parameter estimation; wavelet transforms; adaptive learning rate BP algorithm; additional momentum term; analog circuit failure; analog circuit fault classification; component tolerances; fault types diversity; multisim software; response signal; time-varying signal component; wavelet neural networks-based fault diagnosis; Decision support systems; Zinc; Analog Circuit; Fault Diagnosis; Wavelet Neural Networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Decision Conference (CCDC), 2012 24th Chinese
  • Conference_Location
    Taiyuan
  • Print_ISBN
    978-1-4577-2073-4
  • Type

    conf

  • DOI
    10.1109/CCDC.2012.6244359
  • Filename
    6244359