DocumentCode
2671628
Title
On the eliminating of parameters α and β in STAFAN
Author
Ding, J. ; Hu, Jiankun
Author_Institution
Beijing Univ. of Posts & Telecommun., Beijing
fYear
1993
fDate
16-18 Nov 1993
Firstpage
72
Lastpage
74
Abstract
STAFAN algorithm (1985) is regarded as a good alternative to fault simulation of digital circuits. However, this algorithm has two parameters α and β to be determined by fault simulation and so it is of no practical uses. This article analyzes the probability distribution of random signals at circuit nodes, and proves that controllability is in normal distribution. Thus the unbiasing estimate of fault detection probability can be obtained. Moreover, according to the concept of observability, we can eliminate parameter β. For actual circuits the fault coverage obtained from the modified STAFAN agrees favorably with the fault simulation results
Keywords
controllability; fault location; integrated logic circuits; logic testing; observability; probability; random processes; LSI chips; STAFAN; circuit nodes; combinational circuit; controllability; digital circuits; fault detection probability; fault simulation; normal distribution; observability; probability distribution; random signals; sequential circuit; Circuit faults; Circuit simulation; Digital circuits; Electrical fault detection; Fans; Fault detection; Gaussian distribution; H infinity control; Observability; Probability distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 1993., Proceedings of the Second Asian
Conference_Location
Beijing
Print_ISBN
0-8186-3930-X
Type
conf
DOI
10.1109/ATS.1993.398782
Filename
398782
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