• DocumentCode
    2671628
  • Title

    On the eliminating of parameters α and β in STAFAN

  • Author

    Ding, J. ; Hu, Jiankun

  • Author_Institution
    Beijing Univ. of Posts & Telecommun., Beijing
  • fYear
    1993
  • fDate
    16-18 Nov 1993
  • Firstpage
    72
  • Lastpage
    74
  • Abstract
    STAFAN algorithm (1985) is regarded as a good alternative to fault simulation of digital circuits. However, this algorithm has two parameters α and β to be determined by fault simulation and so it is of no practical uses. This article analyzes the probability distribution of random signals at circuit nodes, and proves that controllability is in normal distribution. Thus the unbiasing estimate of fault detection probability can be obtained. Moreover, according to the concept of observability, we can eliminate parameter β. For actual circuits the fault coverage obtained from the modified STAFAN agrees favorably with the fault simulation results
  • Keywords
    controllability; fault location; integrated logic circuits; logic testing; observability; probability; random processes; LSI chips; STAFAN; circuit nodes; combinational circuit; controllability; digital circuits; fault detection probability; fault simulation; normal distribution; observability; probability distribution; random signals; sequential circuit; Circuit faults; Circuit simulation; Digital circuits; Electrical fault detection; Fans; Fault detection; Gaussian distribution; H infinity control; Observability; Probability distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1993., Proceedings of the Second Asian
  • Conference_Location
    Beijing
  • Print_ISBN
    0-8186-3930-X
  • Type

    conf

  • DOI
    10.1109/ATS.1993.398782
  • Filename
    398782