DocumentCode
2672453
Title
Fault Detection In Intelligent Material
Author
Lee, Jeyull
Author_Institution
National Science Foundation
fYear
1992
fDate
20-22 May 1992
Firstpage
298
Lastpage
307
Keywords
Computer aided manufacturing; Computer integrated manufacturing; Costs; Fault detection; Intelligent sensors; Manufacturing automation; Manufacturing processes; Materials handling; Production facilities; Real time systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Integrated Manufacturing, 1992., Proceedings of the Third International Conference on
Print_ISBN
0-8186-2615-1
Type
conf
DOI
10.1109/CIM.1992.639116
Filename
639116
Link To Document