• DocumentCode
    2674281
  • Title

    Conduction in failing aluminum connections

  • Author

    Aronstein, Jesse

  • fYear
    1990
  • fDate
    20-24 Aug 1990
  • Firstpage
    479
  • Lastpage
    486
  • Abstract
    Conduction in failing aluminum contacts is studied using oscilloscope observation of the current-voltage characteristics. Crossed wire and twisted pair contacts were used in these studies. Measurement of contact resistance as normal force is increased shows that there is little metallic contact established through the aluminum oxide by application of normal force alone. Conduction in these aluminum connections is found to be predominantly metallic, however, established and sustained by the electrical breakdown mechanism known as A-fritting. The metallic conductive channels formed by this mechanism deteriorate and open, causing frequent repetition of the breakdown process. The results indicate that there is likely to be only one conducting channel active at a time. Observations made on aluminum-aluminum twisted pair and twist-on connector splices demonstrate that the same mechanism is operative for these connections. The relationship of the results to behavior of failing aluminum connections is discussed
  • Keywords
    aluminium; contact resistance; electrical contacts; wear; A-fritting; Al-Al2O3-Al contacts; contact resistance; crossed wire contacts; current-voltage characteristics; electrical breakdown mechanism; failing Al-Al contacts; metallic conductive channels; normal force; oscilloscope observation; repetitive electrical breakdown; twist-on connector splices; twisted pair contacts; Aluminum oxide; Circuits; Connectors; Contact resistance; Electric breakdown; Force measurement; Oscilloscopes; Temperature; Voltage; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 1990. Proceedings of the Thirty-Sixth IEEE Holm Conference on ... and the Fifteenth International Conference on Electrical Contacts
  • Conference_Location
    Montreal, Que.
  • Type

    conf

  • DOI
    10.1109/HOLM.1990.113046
  • Filename
    113046