Testing of power connectors-influence of testing parameters

Author

Öberg, Ake ; Olsson, Karl-Erik ; Bohlin, Ake

Author_Institution

ABB Corp. Res., Vasteras, Sweden

fYear

1990

fDate

20-24 Aug 1990

Firstpage

493

Lastpage

498

Abstract

The basic principles of accelerated life testing of electrical contacts are discussed, with special emphasis on aging mechanisms and testing parameters. The testing parameters are described, and their influence on the aging behavior for a given connector type is evaluated. The influence on the aging characteristics of bolted Al/Cu high-current connectors by different testing parameters is studied. The parameters studied are current cycling, short circuits, current type (AC/DC), and current and temperature level. In addition, the influence of contact force on aging behavior is studied. It is concluded that all the parameters significantly influence the aging process. An important prerequisite for self-healing is a sufficiently high contact force, otherwise degradation mechanisms will dominate the aging. Thus it is important to test a specific connector type at its rated clamping force

Keywords

ageing; aluminium; copper; electric connectors; environmental testing; life testing; AC currents; DC currents; accelerated life testing; aging behavior; aging characteristics; aging mechanisms; aging process; bolted Al-Cu high current connectors; contact force; current cycling; current level; degradation mechanisms; high contact force; influence of test parameters; power connectors testing; prerequisite for self-healing; rated clamping force; short circuits; specific connector type; temperature level; testing parameters; Aging; Connectors; Contact resistance; Corrosion; Degradation; Life testing; Oxidation; Stress; System testing; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Contacts, 1990. Proceedings of the Thirty-Sixth IEEE Holm Conference on ... and the Fifteenth International Conference on Electrical Contacts

Conference_Location

Montreal, Que.

Type

conf

DOI

10.1109/HOLM.1990.113048

Filename

113048