DocumentCode
2675325
Title
Exploitation Of Parallelism In Vlsi Array Testing
Author
Choi, Yoon-Hwa
Author_Institution
University of Minnesota
Volume
2
fYear
1988
fDate
1988
Firstpage
867
Lastpage
871
Keywords
Broadcasting; Circuit faults; Circuit testing; Fault diagnosis; Fault location; Parallel processing; Signal processing algorithms; Switches; System testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Signals, Systems and Computers, 1988. Twenty-Second Asilomar Conference on
ISSN
1058-6393
Type
conf
DOI
10.1109/ACSSC.1988.754673
Filename
754673
Link To Document