• DocumentCode
    2675684
  • Title

    THz near-field microscopy applications in device research

  • Author

    Mitrofanov, Oleg

  • Author_Institution
    Electron. & Electr. Eng. Dept., Univ. Coll. London, London, UK
  • fYear
    2011
  • fDate
    2-7 Oct. 2011
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    THz near-field microscopy can make a large impact on development of THz technology. Sub-wavelength spatial resolution and the possibility of time-domain analysis make this method particularly useful in research on THz devices. Applications for device research, including mode analysis in waveguides and surface plasmon wave mapping will be discussed.
  • Keywords
    optical microscopy; surface plasmons; time-domain analysis; subwavelength spatial resolution; surface plasmon wave mapping; terahertz near-field microscopy applications; time-domain analysis; Apertures; Dispersion; Microscopy; Plasmons; Probes; Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 2011 36th International Conference on
  • Conference_Location
    Houston, TX
  • ISSN
    2162-2027
  • Print_ISBN
    978-1-4577-0510-6
  • Electronic_ISBN
    2162-2027
  • Type

    conf

  • DOI
    10.1109/irmmw-THz.2011.6105086
  • Filename
    6105086
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2675684