• DocumentCode
    2676245
  • Title

    A multifunctional laser linking and cutting structure for standard 0.25 μm CMOS-technology

  • Author

    Mende, Ole ; Redeker, Michael ; Rudack, Markus ; Treytnar, Dieter

  • Author_Institution
    Lab. for Inf. Technol., Hannover Univ., Germany
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    114
  • Lastpage
    122
  • Abstract
    A novel laser-switch has been developed, designed and manufactured in a standard 6 level metal CMOS process. The redimensioned laser-switches combine a laser link and via (fuse) corresponding to minimum design rules in a single device. Due to vertical arrangement of the linking and the cutting structure (via), an area reduction of more than 30% is achieved, compared to laser arrays utilizing traditional laser structures. Simultaneous connecting and disconnecting reduces the processing time by 50%, since an additional process step is omitted. The resistance of the formed link structures is very low (R12×12median=0.065 Ω, R10×10median =0.118 Ω). Optimal values have been found for laser parameters to process the cutting structure with 100% yield. A first estimation of life-time results in t0.1=22 a. Arrangements of laser-switches for bus configuration and repair, and for overwriting static configuration signals are proposed
  • Keywords
    CMOS integrated circuits; cutting; integrated circuit interconnections; integrated circuit yield; joining processes; laser beam machining; maintenance engineering; 0.065 ohm; 0.118 ohm; 0.25 μm CMOS-technology; 0.25 mum; area reduction; bus configuration; cutting structure; fuse; laser-switch; multifunctional laser linking; overwriting; repair; simultaneous connecting disconnecting; vertical arrangement; CMOS process; Fuses; Integrated circuit yield; Joining processes; Laser beam cutting; Life estimation; Microelectronics; Optical design; Power lasers; Standards development;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2000. Proceedings. IEEE International Symposium on
  • Conference_Location
    Yamanashi
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-0719-0
  • Type

    conf

  • DOI
    10.1109/DFTVS.2000.887149
  • Filename
    887149