• DocumentCode
    2676527
  • Title

    An experimental evaluation of the effectiveness of automatic rule-based transformations for safety-critical applications

  • Author

    Rebaudengo, Maurizio ; Reorda, Matteo Sonza ; Torchiano, Marco ; Violante, Massimo

  • Author_Institution
    Dipartimento di Autom. e Inf., Politecnico di Torino, Italy
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    257
  • Lastpage
    265
  • Abstract
    Over the last years, an increasing number of safety-critical tasks have been demanded of computer systems. In particular, safety-critical computer-based applications are hitting markets where costs is a major issue, and thus solutions are required which conjugate fault tolerance with low costs. In this paper, a software-based approach for developing safety-critical applications is analyzed. By exploiting an ad-hoc tool implementing the proposed technique, several benchmark applications have been hardened against transient errors. Fault injection campaigns have been performed to evaluate the fault detection capability of the hardened applications. Moreover, a comparison of the proposed techniques with the Algorithm-Based Fault Tolerance (ABFT) approach is proposed. Experimental results show that the proposed approach is far more effective than ABFT in terms of fault detection capability when injecting transient faults in data and code memory, at a cost of an increased memory overhead. Moreover, the performance penalty introduced by the proposed technique is comparable, and sometimes lower, than that ABFT requires
  • Keywords
    safety-critical software; software fault tolerance; automatic rule-based transformations; benchmark applications; fault detection capability; hardened application; memory overhead; safety-critical applications; transient errors; Application software; Automotive engineering; Circuit faults; Computer applications; Costs; Fault detection; Fault tolerance; Hardware; Performance evaluation; Programming profession;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2000. Proceedings. IEEE International Symposium on
  • Conference_Location
    Yamanashi
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-0719-0
  • Type

    conf

  • DOI
    10.1109/DFTVS.2000.887164
  • Filename
    887164