• DocumentCode
    2676603
  • Title

    Procedure for the regional scale mapping of FVC and LAI over land degradated areas in the DeSurvey project

  • Author

    Martinez, Brais ; Verger, A. ; García-Haro ; Gilabert, F.J. ; Melia, J.

  • Author_Institution
    Univ. de Valencia, Valencia
  • fYear
    2007
  • fDate
    23-28 July 2007
  • Firstpage
    3452
  • Lastpage
    3455
  • Abstract
    The aim of this work is to analyze the consistency of the FVC and LAI regional scale mapping products derived from new generation of sensor systems, SPOT/VEGETATION and MSG/SEVIRI, for vegetation monitoring, especially over hot spot areas affected by land degradation processes. The FVC has been developed from a probabilistic Spectral Mixture Analysis (SMA) using as input the nadir-zenith normalized TOC reflectance coefficient (k0) for the different spectral channels. In this sense, using k0 as input accounts for the different acquisition geometry in the data. FVC is subsequently used to estimate LAI using the Roujean and Lacaze semi-empirical relationship. The results have demonstrated the competitiveness of the FVC and LAI derived products regarding similar satellite products at local scales and the suitability of using them to reproduce the temporal variability over dryland condition areas.
  • Keywords
    data acquisition; terrain mapping; vegetation; vegetation mapping; DeSurvey project; FVC; LAI; MSG/SEVIRI; Roujean and Lacaze semiempirical relationship; SPOT/VEGETATION; TOC reflectance coefficient; acquisition geometry; land degradated areas; probabilistic spectral mixture analysis; regional scale mapping; sensor systems; vegetation monitoring; Anisotropic magnetoresistance; Bayesian methods; Condition monitoring; Degradation; Geometry; Land surface; Reflectivity; Sensor systems; Spectral analysis; Vegetation mapping; FVC; LAI; land degradation; processes; regional products;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium, 2007. IGARSS 2007. IEEE International
  • Conference_Location
    Barcelona
  • Print_ISBN
    978-1-4244-1211-2
  • Electronic_ISBN
    978-1-4244-1212-9
  • Type

    conf

  • DOI
    10.1109/IGARSS.2007.4423588
  • Filename
    4423588