DocumentCode
2676610
Title
A DC-10.5-GHz CMOS Distributed Amplifier with 3.2±0.3 dB NF, 10.5±1.4 dB Gain and ±13.8 ps Group Delay Variation
Author
Chang, Jin-Fa ; Lin, Yo-Sheng
Author_Institution
Dept. of Electr. Eng., Nat. Chi Nan Univ., Puli, Taiwan
fYear
2011
fDate
16-19 Jan. 2011
Firstpage
307
Lastpage
310
Abstract
A DC-10.5-GHz CMOS distributed amplifier (DA) with flat and low noise figure (NF), flat and high power gain (S21), and small group delay variation using standard 0.18 μm CMOS technology is demonstrated. Flat and low NF was achieved by adopting the proposed RLC terminal network with 140 Ω terminal resistance at dc and very high frequencies (instead of the traditional 50 Ω terminal resistance or the recently proposed RL terminal network) for the gate transmission line, and a slightly under-damped Q-factor for the second-order NF frequency response. Besides, flat and high S21 was achieved by using cascoded transistors as the gain cell. Over the DC-10.5-GHz band, the DA consumed 29.16 mW and achieved flat and high S21 of 10.5±1.4 dB, flat and low NF of 3.2±0.3 dB, and excellent phase linearity (the group delay variation was only ±13.8 ps), one of the best NF and phase linearity results ever reported for a CMOS DA or wideband LNA with bandwidth greater 7.5 GHz.
Keywords
CMOS analogue integrated circuits; Q-factor; distributed amplifiers; microwave amplifiers; microwave integrated circuits; CMOS distributed amplifier; cascoded transistors; flat noise figure; frequency 10.5 GHz; gate transmission line; group delay variation; low noise figure; power 29.16 mW; resistance 140 ohm; second-order NF frequency response; size 0.18 mum; slightly under-damped Q-factor; time -13.8 ps; time 13.8 ps; CMOS integrated circuits; Frequency measurement; Gain; Logic gates; Noise measurement; Resistance; Semiconductor device modeling; CMOS; NF; distributed amplifier; gain; group delay variation; low-noise amplifier;
fLanguage
English
Publisher
ieee
Conference_Titel
Radio and Wireless Symposium (RWS), 2011 IEEE
Conference_Location
Phoenix, AZ
Print_ISBN
978-1-4244-7687-9
Type
conf
DOI
10.1109/RWS.2011.5725429
Filename
5725429
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