• DocumentCode
    2676630
  • Title

    Testing the configurability of dynamic FPGAs

  • Author

    Park, N. ; Ruiwale, S.J. ; Lombardi, F.

  • Author_Institution
    Dept. of Comput. Sci., Oklahoma State Univ., Stillwater, OK, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    311
  • Lastpage
    319
  • Abstract
    This paper addresses configurability testing of dynamic FPGAs, i.e. the process to test the state configuration of the FPGA through specific functions which permits one to establish controllability and observability (by read and write operations). Configurability is accomplished in a dynamic FPGA by using a dedicated CPU interface. The CPU interface is characterized by different functional modules (mainly at register level) to permit state access; this is achieved using mapping, masking and addressing functions, and is tested for stuck-at and bridging faults in the bits of the Map and Mask Registers. The proposed approach for configurability testing has been evaluated on the XC6216 FPGA
  • Keywords
    VLSI; controllability; field programmable gate arrays; integrated circuit testing; logic testing; observability; XC6216 FPGA; addressing functions; bridging faults; configurability testing; controllability; dedicated CPU interface; dynamic FPGA; dynamically reconfigurable FPGAs; map register; mapping functions; mask register; masking functions; observability; state access; state configuration; stuck-at faults; Circuit faults; Circuit testing; Controllability; Field programmable gate arrays; Logic testing; Observability; Programmable logic arrays; Programmable logic devices; Reconfigurable logic; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2000. Proceedings. IEEE International Symposium on
  • Conference_Location
    Yamanashi
  • ISSN
    1550-5774
  • Print_ISBN
    0-7695-0719-0
  • Type

    conf

  • DOI
    10.1109/DFTVS.2000.887171
  • Filename
    887171